Traditionally, material/device characterisation applications have required a combination of specialised DC and AC instruments – often resulting in complicated setups that also require highly skilled operators to integrate and operate equipment of mixed brands, computer interfaces, and types. Such setups often employ long cables between instruments and the sample, and as channel counts increase, so do the challenges of minimising system noise and ensuring channel-to-channel timing and reference frequency synchronisation.
This webinar will explore a new approach: the use of a highly synchronised, AC + DC sourcing and measurement system that utilises remote analog modules for optimum sensitivity and noise rejection to accurately characterise samples. The instrument architecture for directing low-level measurements from DC to 100 kHz ensures inherently synchronised data from 1 to 3 measurement channels which can be coordinated with up to 3 source channels or an external reference signal. In this way, this novel platform is highly adaptable for a range of R&D applications, including photosensor development, novel photovoltaic material characterisation, and low-noise transistor measurements.