Instrumentation Monthly Test | Measurement | Control
Keysight Technologies has announced the selection of two new Keysight Fellows, a designation reserved for the highest level of achievement for an individual contributor in the company. Bill Anklam and Lee Barford each received the promotion through a rigorous selection process led by Jay Alexander, Keysight chief technology officer and vice president. The Fellow designation is reserved for those who have distinguished themselves through enterprise-level technical and strategic contributions. They serve as external company ambassadors and role models who exemplify technical excellence and extraordinary values.
Anklam, who works in the measurement technology section of Keysight’s Technology Leadership Organisation, has focused on signal processing architecture. He has a Bachelor of Science degree in electrical engineering from Iowa State University, and Master of Science and Engineer degrees in electrical engineering from Stanford University. With over 30 years of experience, Anklam has made significant contributions in the development of signal processing devices and techniques.
Barford, who works in Keysight Laboratories, has recently focused on parallel computing and related technologies. He holds a doctorate in computer science from Cornell University, and has made significant technology contributions in a wide range of technical domains including X-ray inspection, model-based test and communications network test.
“Bill and Lee are outstanding examples of technical leadership at Keysight,” said Alexander. “Their contributions to the industry have been significant, and I’m excited to see them and our other Keysight Fellows continue to drive the measurement innovations needed by our customers around the world.”
