Industrial metrology specialist, The Sempre Group, has introduced the new S neox 3D optical profilermicroscope, designed specifically for sub-nano, nano and micro-scale measurement. Designed and manufactured by new partner Sensofar, the 3D profiler includes three different optical measurement techniques in one sensor head to measure different textures and structures across varying surface scales. As well as being compact and lightweight, the new system provides a versatile solution for researchers because of its advanced inspection and analysis capabilities.
The Sempre Group now offers three optical metrology systems from Sensofar. As well as the flagship S neox, it supplies the S wide scanning system and the S neox Five Axis that can be combined with theprofiler to measure samples at different rotations and elevations. The improved S neox design is optimised for flexibility and is suitable for both research and development (R&D) and quality control (QC) in laboratories. The technology also comes with SensoSCAN software that has an intuitive and user-friendly interface so that users of any level of expertise can easily use the technology.
The new profiler is unique because it allows the user to switch between confocal, interferometry and active illumination focus variation methods without requiring multiple systems. This three-in-one approach gives researchers and other users flexibility in their measuring processes and can save on the costs associated with purchasing additional technology. Users can also program the system to run 24 hours-a-day, reducing downtime by removing the need to swap between systems.
“Researchers working with 3D profiling often have to alternate between systems depending on the optical techniques they require, and this can delay surface inspections and analysis,” explained Mike John, managing director at The Sempre Group. “The S neox is unique in combining these different opticaltechniques and it can deliver real efficiency and cost-saving benefits for the user.
“The technology can also operate at high speeds and data measurement acquisition is now five times faster than before,” continued John. “At 180 frame rates per second, it is without a doubt the fastest areal measurement system on the market and is right up there in terms of functionality and performance.”
The 3D profiling microscope and optical metrology systems have a wide range of potential applications, such as microelectronics to assess coating thickness in microns, as well as aerospace and additive manufacturing. The systems can also be used by palaeontologists to analyse bone structures.