Tag Archives: ellipsometry

J.A. Woollam has teamed up with Linkam to bring precise temperature control to its ellipsometry instruments

Thin films can be used to modify the optical characteristics of a surface, its electrical conductivity, its hardness or lubricity, its corrosion resistance, and its chemical inertness. It is important to understand how these properties are affected by temperature. Some materials even go through a phase transition at specific temperatures …

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20th Annual J A Woollam Spectroscopic Ellipsometer Online Workshop

Quantum Design UK and Ireland is celebrating 20 years of Spectroscopic Ellipsometry workshops with its partners, J A Woollam. This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry.  The format of the workshop will include an introduction, fundamentals of ellipsometric data …

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