Focused products to be demonstrated at IEEE

Keysight Technologies has announced it will demonstrate some of its focused products at EMC 2014, the IEEE International Symposium on Electromagnetic Compatibility, Raleigh Convention Center, Booth 323, Raleigh, North Carolina, Aug. 5th – 7th.

Keysight experts will demonstrate:

o full-compliance CISPR16-1-1 and MIL-STD-461 EMI measurements made with the Keysight N9038A MXE EMI receiver, which enable designers to fully, repeatedly and reliably test a range of devices with both accuracy and sensitivity to 44 GHz.

o pre-compliance measurements and diagnostic evaluation made with the N6141A EMI measurement application on X-Series signal analysers;

o Keysight EEsof EDA tools like the EMPro 3-D electromagnetic simulation software, which provide valuable signal integrity solutions for identifying potential sources of EMI;

o Keysight’s network analysers, which offer S-parameter measurements in both frequency and time domains for EMC site validation;

o high-speed digital design, validation and fixture removal using the Physical Layer Test Software and associated measurement hardware, and network and impedance measurements using the ENA network analyser and the new E4990A/1B impedance analysers, which enable designers to characterize PDN components like capacitors and DC-DC converters for power integrity applications—all of which are useful in addressing signal and power integrity issues; and

o portable RF handhelds that allow designers to easily monitor signals and test components.

Keysight will present two technical papers at the symposium. Dr. Fangyi Rao, master R&D engineer, Keysight EDA, will present “Jitter Induced Voltage Noise in Clock Channels” as part of the IEEE International Conference on Signal and Power Integrity on Aug. 5th. On Aug. 6th, Dr. Colin Warwick, product manager for high-speed digital design and Rick Carter, application engineer, Keysight EDA, will present “EMI/EMC Analysis for High-Speed Digital Design.”


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