Instrumentation Monthly Test | Measurement | Control
An Agilent 5600LS atomic force microscope has been installed at the Cambridge Graphene Centre (CGC). The CGC, one of the key consortium partners in the Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology at the University of Cambridge.
An Agilent 5600LS AFM with scanning microwave microscopy capabilities has been installed at the Cambridge Graphene Centre (CGC) for research on graphene and other two-dimensional materials.
Graphene is the second layer of carbon atoms that are sp2 covalently bonded into a honeycomb lattice. Much of graphene’s appeal comes from its unique electronic properties that may one day make super-high-speed devices a reality. SMM, an AFM-based electrical characterization technique developed by Agilent, will be used to explore various properties of graphene and related materials (e.g., capacitance, impedance and dielectric properties) at the nanoscale.
The Graphene Flagship is a joint, coordinated research initiative. It is an academic-industrial consortium focused on a breakthrough in technological innovation. Research will encompass materials production to components and system integration, and targets a number of specific goals that leverage the unique properties of graphene and related materials.
